Our systems combine high-NA optics with AI-based defect classification, enabling surface and subsurface analysis with nanometer precision – inline, non-destructive, and on virtually any material.
Take the opportunity to speak with our experts and learn how Confovis can make your processes more efficient, reliable, and future-ready.
Get your free visitor ticket for SEMICON Europa 2025!
- Experience our technology: Get an inside look at our high-NA optics, AI-based defect classification, and infrared Structured Illumination Microscopy (IR-SIM) – and discover how Confovis sets new standards in optical wafer inspection.
- Explore new developments: Learn more about the Confovis technology roadmap and how our solutions address both current and future requirements in semiconductor manufacturing.
- Exchange with experts: Discuss your technical questions directly with our specialists and benefit from our deep application expertise and hands-on industry experience.
Free visitor tickets for SEMICON Europa
Request your ticket and book a meeting
Secure your complimentary visitor ticket for SEMICON Europa 2025.
Please complete the form at the bottom of this page. You will then receive your personal registration link from Messe München, which allows you to register and download your ticket.
We look forward to meeting you!
At Confovis, we look forward to discussing today’s challenges in semiconductor manufacturing – and showing you how our inspection and metrology systems deliver precise and reliable results across diverse wafer applications.
