Delivery of the 100th measuring system A WAFERinspect AOI System was delivered to a customer in the semiconductor sector at the end of 2021, the altogether 100th measuring system Confovis GmbH produced in its 12-year corporate history. With its WAFERinspect AOI, Confovis offers a tool with automated wafer handling that allows confocal 3D measurements for…
Confovis extends its product portfolio with the WAFERinspect AOI Defect detection and metrology in one system With the WAFERinspect AOI measuring system, Confovis is expanding its WAFERinspect product range with an AOI tool which combines defect inspection, defect review as well as 2D and 3D measurements in a single system. Defect detection and classification was…
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