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Starting from the application, Confovis develops measuring systems tailored to the requirements of different industries. The measuring devices are extremely flexible and of modular design and can be customized in terms of size, features and technology. With the dedicated measuring software ConfoVIZ® and the corresponding established evaluation software such as MountainsMap© or GOM© extensive measurements on surfaces, microstructures, etc. can be performed and evaluated. Depending on the configuration, the measuring systems are available as manual, semi-automatic or even fully automatic versions. Measuring procedures can be performed simply and reliably according to measuring plan or recipe.

WAFERinspect

Reliable 3D & 2D measurements for the semiconductor industry

LEADinspect

Measurement of micro and macro lead in one measuring procedure

TOOLinspect

Analysis of different surfaces

ROLLERinspect

Automatic defect detection and defect inspection

  • No use of noise filters, complete transparency of raw data
  • Measurement of reflecting, transparent and diffuse surfaces
  • Roughness measurement can be traced to any roughness standard
  • Simple to operate: 3 clicks for the measurement, 1 click for the evaluation
  • Short measuring time: almost like a stylus instrument
  • Automation and QS database interfaces
Confovis

Contact us:

+49 3641 27 410 – 00


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