The combination of fast defect detection by means of a line camera and a classifier has stood the acid test of practical application. The subsequent step of quantifying defects (particularly the height of points of impact) has always been a manual process, either by means of tactile or confocal measurement. The retrieval and the positioning of the defect in the confocal microscope took up most of the time. The associated logistic challenges and the continuity or tracing of data are extremely complex.
By combining defect detection and defect measurement in a common positioning unit and transformation of coordinates, a manual step that takes up much time and makes parts difficult to trace is omitted. The user obtains quantitative information the generation of which usually takes 20 minutes or more within a matter of seconds.