News

Confovis extends its product portfolio with the WAFERinspect AOI

Confovis extends its product portfolio with the WAFERinspect AOI Defect detection and metrology in one system With the WAFERinspect AOI measuring system, Confovis is expanding its WAFERinspect product range with an AOI tool which combines defect inspection, defect review…
Mehr lesen
Wafer Analyse mit Confovis

The Swiss Army Knife for wafer analysis

The Swiss Army Knife for wafer analysis Confovis, the optical metrology specialist from Jena, Germany, presents its fully automated measurement system for wafer inspection of different wafer types (MEMS, Standard, Thin, Taiko, Warped, Frame). The measurement system WAFERinspect combines…
Mehr lesen
Prozessüberwachung in der Dioden-Herstellung mit Confovis

Measurement technology allows for rapid process monitoring in diode production

Measurement technology allows for rapid process monitoring in diodeproduction The measurement technology specialist Confovis GmbH, Jena uses detailed measurement data to provide comprehensive information concerning the process and product quality for the laser diode manufacturer Lumics GmbH from Berlin.…
Mehr lesen
Qualitätsprüfung additiv gefertigter Bauteile

Contactless quality inspection of additive manufactured components

Contactless quality inspection of additive manufactured components By means of additive manufacturing technology, such as selective laser sintering, geometries which are not possible using established manufacturing processes can be achieved. The surface of such additive manufactured components often has…
Mehr lesen
Automatisierte Wafer Analyse mit Confovis

Automatic microscopy on semiconductor wafers

Automatic microscopy on semiconductor wafers: confovis GmbH is presenting the latest generation of automatic measuring systems for the industry at the international trade fair for semiconductor technology, “Semicon Europe”. The experts for 3D surface analysis will be exhibiting the…
Mehr lesen