News | Optical metrology

The Swiss Army Knife for wafer analysis

30. October 2018

The Swiss Army Knife for wafer analysis Confovis, the optical metrology specialist from Jena, Germany, presents its fully automated measurement system for multi-process-analysis for different wafer types (MEMS, Standard, Thin, Taiko, Warped, Frame) at the Semicon 2018 in Munich.…

Prozessüberwachung in der Dioden-Herstellung mit Confovis

Measurement technology allows for rapid process monitoring in diode production

18. April 2017

Measurement technology allows for rapid process monitoring in diodeproduction The measurement technology specialist Confovis GmbH, Jena uses detailed measurement data to provide comprehensive information concerning the process and product quality for the laser diode manufacturer Lumics GmbH from Berlin.…

Qualitätsprüfung additiv gefertigter Bauteile

Contactless quality inspection of additive manufactured components

27. July 2015

Contactless quality inspection of additive manufactured components By means of additive manufacturing technology, such as selective laser sintering, geometries which are not possible using established manufacturing processes can be achieved. The surface of such additive manufactured components often has…

Automatisierte Wafer Analyse mit Confovis

Automatic microscopy on semiconductor wafers

30. September 2013

Automatic microscopy on semiconductor wafers: confovis GmbH is presenting the latest generation of automatic measuring systems for the industry at the international trade fair for semiconductor technology, “Semicon Europe”. The experts for 3D surface analysis will be exhibiting the…