Confovis extends its product portfolio with the WAFERinspect AOI Defect detection and metrology in one system With the WAFERinspect AOI measuring system, Confovis is expanding its WAFERinspect product range with an AOI tool which combines defect inspection, defect review…

The Swiss Army Knife for wafer analysis Confovis, the optical metrology specialist from Jena, Germany, presents its fully automated measurement system for wafer inspection of different wafer types (MEMS, Standard, Thin, Taiko, Warped, Frame). The measurement system WAFERinspect combines…

Measurement technology allows for rapid process monitoring in diodeproduction The measurement technology specialist Confovis GmbH, Jena uses detailed measurement data to provide comprehensive information concerning the process and product quality for the laser diode manufacturer Lumics GmbH from Berlin.…

Automatic microscopy on semiconductor wafers: confovis GmbH is presenting the latest generation of automatic measuring systems for the industry at the international trade fair for semiconductor technology, “Semicon Europe”. The experts for 3D surface analysis will be exhibiting the…