WAFERinspect Semi-Automated

Precision Inspection and Metrology with Enhanced Efficiency

confovis · Products · WAFERinspect Systems · WAFERinspect Semi-Automated

Semi-Automated AOI Systems

At Confovis, our semi-automated AOI systems bridge the gap between visual and fully automated optical inspection systems. They offer the benefits of operator-independent results, making them ideal for industries that require highly reliable results with no slippage (undetected defects). The semi-automated WAFERinspect solutions can accommodate a wide range of wafer sizes and materials thanks to our universal handling system.

 Whether inspecting surface defects or verifying dimensional accuracy, our systems adapt to your needs.

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Key Features of the Semi-Automated WAFERinspect Tools

Precision and Reliability

Our semi-automated systems offer high-resolution defect inspection and metrology. With advanced optics and software algorithms, even the smallest anomalies are identified with unmatched accuracy.

User-Friendly Operation

The systems allow operators to maintain hands-on control during critical inspection stages, while automating repetitive tasks for consistent results. This reduces operator fatigue and ensures high throughput without compromising quality.

Customizable Workflows

Each system can be tailored to meet specific inspection requirements, allowing for custom parameter settings, scan sequences, and report formats.

Fast Setup and Easy Integration

Designed for seamless integration into existing production flows or as stand-alone systems, our semi-automated AOI systems offer fast set-up times and minimal maintenance. They are compatible with various industry standards and can be easily upgraded to a fully automated system with an EFEM to meet future requirements.

Scalable and Cost-Effective

For companies looking to scale their operations without the cost of full host-controlled automation, our semi-automated systems offer an ideal solution. They offer a cost-effective approach to improving production quality and identifying process excursions as early as possible.

WAFERinspect Semi-Automated Applications

Semi-automated AOI systems for every wafer size, material and application

Our semi-automated systems are uniquely designed to accommodate a wide range of wafer sizes, from 2” to 12”, thanks to our universal handling system, ensuring compatibility with diverse production needs.

These systems seamlessly adapt to various materials, from silicon to compound semiconductors and transparent substartes like glass, as well as different sample types, including integrated circuits (ICs), application-specific integrated circuits (ASICs), and any package type.

This versatility makes them an ideal choice for manufacturers requiring precise, reliable inspection across a broad spectrum of applications.

The tools are designed for companies that need a balance between manual flexibility and automated precision. They reduce human error, improve inspection accuracy, and optimize production lines.

With our advanced technology and commitment to quality, you can be confident in achieving the highest standards of product inspection.

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