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Home
Products
WAFERinspect
TOOLinspect
LEADinspect
Applications
Wafer Inspection
AOI – Automated optical inspection
Wafer Metrology
Wafer Bump Inspection
Surface Metrology
Roughness Measurement
Lead Analysis
Industries
3DIC
Photonics
MEMS
Compound Semiconductors
Power Semiconductors
RF – Radio Frequency Technologies
Company
Why Confovis?
News & Events
News
Events
Resources
Careers
Professionals & Graduates
Students
Job Portal
Contact
Contact
Service & Support
Sales partners
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