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Full 3D defect and anomaly inspection for inline semiconductor manufacturing

Compound semiconductors are found in a growing range of technology applications. The compound semiconductor market is a multi-billion market which is expected to grow by one order of magnitude within the next decade.

To keep up with the pace and to remain competitive, it is of primary importance for semiconductor manu- facturers to increase their yield while reducing costs. Moreover, the constantly increasing requirements concerning components’ reliability make an optical inspection necessary for all critical processing steps.

Optical high-resolution image-based defect inspection on compound semiconductors

With the increase in volume and demand for smaller, faster, and more power-efficient integrated circuits, compound semiconductors have gained significant importance over silicon. 

In this case study, the authors intend to describe a novel implemented solution based on high-resolution images obtained with an automated optical inspection (AOI) system, combined with an artificial intelligence-based approach to identify, and classify defects for the purpose of a stable monitoring of the processing of compound semiconductors.

Challenges for the optical inspection of glass & compound semiconductor wafers

Compound semiconductors are found in a growing range of technology applications. The compound semiconductor market is a multi-billion market which is expected to grow by one order of magnitude within the next decade.

To keep up with the pace and to remain competitive, it is of primary importance for semiconductor manufacturers to increase their yield while reducing costs. Moreover, the constantly increasing requirements concerning components’ reliability make an optical inspection necessary for all critical processing steps.

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