Whitepaper

confovis ⋯ Company ⋯ Resources ⋯ Whitepaper – Full 3D defect and anomaly inspection for inline semiconductor manufacturing
Full 3D defect and anomaly inspection for inline semiconductor manufacturing

From Front-End-of-Line to Back-End-of-Line to Advanced Packaging: We’ve got you covered!

Automated optical inspection (AOI) systems are essential tools for all semiconductor manufacturing lines wanting to increase their production yield and quality management while reducing costs.

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    Confovis GmbH

    Tel: +49 3641 27 410 – 00

    • Fast and with nanometer precision
    • Flexibel
    • High level of automation