Confovis specializes in automated optical inspection (AOI) and 3D metrology, tailored to meet the specific requirements of industry and research. At the core of our inspection & metrology tools is our patented confocal measurement technology, Structured Illumination Microscopy (SIM), delivering exceptional precision and speed.
We understand the dynamic challenges of modern industries, which is why our systems are designed for flexibility and adaptability.
Confovis stands for customer satisfaction and a correspondingly high level of commitment.
Confovis Solutions for Your Application
From inspecting micro-lenses and compound semiconductors to evaluating advanced packaging techniques, Confovis provides reliable solutions that meet the highest standards of quality and performance:
Implemented Customer Solutions
Implemented Customer Solutions