Confovis specializes in automated optical inspection (AOI) and 3D metrology, tailored to meet the specific requirements of industry and research. At the core of our inspection & metrology tools is our patented confocal measurement technology, Structured Illumination Microscopy (SIM), delivering exceptional precision and speed.
We understand the dynamic challenges of modern industries, which is why our systems are designed for flexibility and adaptability.
Confovis stands for customer satisfaction and a correspondingly high level of commitment.
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Implemented customer solutions