Careers at confovis


For students

Are you a Bachelor or Master student (m/f/d) looking for a practical partner for your thesis or would you like to gain practical experience alongside your studies?

We offer you the opportunity to join us as an intern, working student or Bachelorand/Masterand.

As a bachelor/master student, you will write your thesis with us with a practical focus. We offer a variety of topics in the fields of software, construction and optics.

As an intern or working student, you help us with our daily activities for an extended period of time and take on your own tasks and projects. Your studies take priority and you can adjust your working days and hours with flexibility.

Current theses


With our confocal measuring systems, a sample is scanned in several planes and the contrast between the successive images is calculated. This finally results in a contrast curve with (at least) one maximum. Due to measurement disturbances or optical effects, the maximum is not always clearly defined and errors in its determination result in measurement errors. With the availability of a large number of these contrast curves, the goal of this work is to determine to what extent AI can be used to reliably determine the maximum.

The automatic inspection of wafers in semiconductor production is a growing business sector. This task is about providing a quality assessment based on gray images of the wafers. Based on images and the evaluation of experts, an AI-supported model is to be developed that enables an evaluation of the wafers based solely on a gray image.

Optical artifacts (e.g. image field curvature) occur due to the lenses used and the exposure. These artifacts result in measurement inaccuracies of the optical process and must be corrected. These corrections are mathematically complex and costly and therefore offer potential for optimization.

The detection of defects in semiconductor production is an important tool for quality assurance. We develop and produce systems for the automatic detection of different defects on wafers. The challenge is that different defect types present themselves differently depending on the illumination. The goal of this task is to optimize the illumination parameters so that as many defects as possible are detected.

Wafer substrates are only 100% flat in the ideal world. In reality, they often exhibit so-called bending or warpage, which raises the need for automated focus tracking during a scan measurement. One way to address this is to record a focus grid prior to wafer measurement. The acquisition of such a focus grid requires several input parameters and assumptions concerning the dimensions of the wafer and the illumination optics used. The goal should be to use all the available wafer and machine parameters to dynamically determine the necessary frequency and positioning of the raster before execution.

Construction & Optics

Contents: Design of assemblies and components for the next generation of our measurement systems, concept and selection of purchased parts and suppliers, assembly and testing of the designed assemblies.

Contents: Mechanical integration of additional sensors (chromatic-confocal or laser triangulation sensors) into our measurement systems, design of assemblies and components, concept and selection of purchased parts and suppliers, assembly and testing of the designed assemblies.

Contents: Concept design, simulation of the illumination beam path (ZEMAX), evaluation and selection of LEDs and illumination optics, realization of a proof-of-concept.

Contents: Design of statically and dynamically stressed components to ensure function, taking into account expected loads and manufacturing tolerances.