Press-fit zones need to ensure a highly conductive and mechanically stable connection with the through-plated holes in the printed circuit board. This requires measuring the press-fit pins geometrically. It is above all the edge radii, varying diameters and transitions which make high demands on the measurement technology that requires a distortion-free measurement of the component.
The Confovis measuring systems use two measurement methods that complement each other for the optical measurement of the press-fit pins in nanometer precision:
- focus variation
- confocal measurement according to the patented working principle of Structured Illumination Microscopy (SIM)
This combination will make it possible to geometrically measure both any traces of roughness and optically reflective surfaces in press-fit zones, but also larger pressing tools and pins.