Confovis Products
confovis ·
Confovis offers a range of tools designed for precise metrology and inspection across various industries, with a focus on semiconductor manufacturing and surface analysis.
They are available as manual, semi-automated or fully automated systems to cope with the needs of R&D, production, and quality control. Real-time measurements allow fast and accurate quality assurance of components and assemblies in production lines.
The WAFERinspect combines automated optical inspection (AOI) with metrology to deliver comprehensive 2D and 3D measurements, alongside high-speed and sub-micron resolution defect inspection for wafers.
The TOOLinspect is a high-precision metrology tool for functional surfaces. The combination of patented confocal microscopy and focus variation makes it possible to measure and analyze a wide variety of surfaces in 3D.
The LEADinspect is a high-precision metrology tool, offering a standard-compliant analysis of both micro- and macro-lead in one measurement run. In addition, it can measure roughness and analyze dominant waviness in accordance.
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