Measurement technology allows for rapid process monitoring in diode production

Optical measurement technology supports quality control at the laser diode manufacturer Lumics GmbH...

Category: News


Tool Inspect measurement system at the Hanover Fair 2017

Confovis presents its Tool Inspect optical measurement system for quick and automated measurement of tools and micro-components at the Hanover Fair 2017. The measurement system offers two measurement procedure in one measuring...

Category: News


Quality inspection of additive manufactured components

The surface of such additive manufactured components often has a high roughness.To monitor the surface quality throughout the entire process chain, innovative 3D measurement technology from Confovis is used...

Category: News


Integrated measurement systems at the Control 2015

True to the motto "flexible in design, high accuracy in application", Confovis is displaying their expanded product range of highly integrated measurement solutions at Control 2015.

Category: News


Successful certification according to ISO 9001:2008 standard

Confovis is setting a course for entry into the tool and machine engineering markets, as well as into the automotive sector. With certification pursuant to ISO 9001, the business is going a stop further in the direction of being...

Category: News


Confovis at the Trade Fair Control 2014

confovis presents solutions for the automotive, aerospace and semiconductor industries

Category: News


New dimensions of optical metrology: large field of view for small time window

ConfoGate CGM-100 with a image field of 2,5 x 2,0 mm allows standardized roughness measurements for the first time in measuring times comparable with tactile measuring systems.

Category: News


Portal measuring system for defect analysis of optical lenses

The Portal System ConfoPort CPO-LV-SD with its positioning unit allows fast non- contact quality inspection of the surface integrity of optical lenses down to the nanometer range. It generates three-dimensional analyses even of...

Category: News

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