Case Study

Optical High-Resolution Image-Based Defect Inspection on Compound Semiconductors

confovis · Company · Resources · Case Study – Optical high-resolution image-based defect inspection on compound semiconductors

Unprecedented precision and reliability in compound semiconductor defect detection with an AI-driven, high-resolution optical inspection solution

With the increasing volume and demand for smaller, faster, and more power-efficient integrated circuits, compound semiconductors have gained significant importance over silicon. This case study describes a novel implemented solution based on high-resolution images obtained with an automated optical inspection (AOI) system, combined with an artificial intelligence-based approach to defect identification, and classification for the purpose of a stable monitoring of compound semiconductors processing.

In our Case Study you will

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